Effective test vectors and methods for their generation play a significant role in testing both software and hardware. One of the most cost-effective approaches to the problem of test vector generation is the random vector approach. Currently, many new methods have been proposed in the literature that significantly improve the efficiency of random testing, belonging to the group of controlled random testing. In this approach, selected parameters of the generated vectors are predetermined. This article will propose a new method for generating test vectors. In the proposed approach, the Maximization of the Minimum Hamming Distance will be used as their fitness function, in contrast to the standard Hamming distance used in the approach known from the literature. This will allow for the generation of optimal test vectors, the effectiveness of which will be verified in relation to PSF memory faults. One of the most visible manifestations of the gigantic scientific and technical progress today is the level of development of digital electronics. One of the effects of this development, or perhaps more its cause, is the ever-increasing demand for broadly understood digital systems. (…)
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Source: Logistyka Magazine