The article presents a proposal for using March-type tests for the effective detection of complex faults (faults involving dependencies between multiple memory cells) occurring in RAM. The proposed idea leaves the values in the tested system unchanged after the test session is completed. It can therefore be used for cyclic memory testing during the normal operation of electronic devices containing RAM. The presented technique allows for the detection of all complex faults existing in the memory with a very high probability. The use of March-type tests in the proposed idea also guarantees the detection of all simple faults located in the memory.Due to the number of cells involved in a fault, memory faults can be divided into faults related to a single memory cell (e.g., Stuck-at Fault) and faults related to multiple memory cells (e.g., Coupling Fault, Pattern
Sensitive Fault). A general case of a fault belonging to the second group is the Pattern Sensitive Fault type, where n memory cells are linked by a dependency. The value (or the possibility of changing the value) of one of these cells (the base cell) depends on the values and their changes in the n-1 remaining cells linked by this fault. (…)
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Source: Logistyka Magazine